High-speed Digital Data Logger
Saelig Company, Inc. has introduced LOG Storm, a new high-speed digital data logger for troubleshooting digital system buses. LOG Storm contains an 8 MSample memory buffer, enabling large bursts of data up to 20bits at 100 MHz to be sampled. A USB connection is used to stream collected data to the PC, enabling Gigabytes of data storage. LOG Storm’s most useful feature is its data filtering capability, efficiently storing only relevant data.
Design engineers often use a logic analyzer for digital system debug. But they frequently report that this type of equipment is unhelpful when problems result from a long sequence of combined software and hardware events. Logic analyzers cannot record sufficient depths of relevant data history to be useful. In contrast, LOG Storm is a dedicated hardware/software combination that can collect high-speed digital bus activity for periods of hours or even days, and extract specific functional events of interest.
‘Due to customer demand, we have addressed one of the most common problems in digital embedded system debugging: the need to understand the history of events that lead to a bug’, Frederic Leens, Sales & Marketing Manager at Byte Paradigm (Belgium) comments. ‘Most oscilloscopes and logic analyzers do not have the capability of recording hours or days of digital trace data. LOG Storm provides the high speed data sampling, large storage capacity, and pre-filtering necessary to extract useful, relevant digital bus traffic evidence to quickly solve complex system debug problems.’
LOG Storm offers compact, easy-to-deploy data logging with huge storage capability, a high sampling rate and rich data storage qualification capabilities. Examples of use include: SPI message monitoring of specific slave select lines; continuous, filtered data packet header evaluation; long-term bus monitoring; in-lab development; on-site, after-installation servicing for chip-to-chip communication emulation, IP evaluation, etc.
LOG Storm will be introduced at the DesignWest Conference and Exhibition in San Jose on March 27-29, 2012.