Digital Serial Analyzer Oscilloscope


Digital Serial Analyzer Oscilloscope

Digital Serial Analyzer Oscilloscope

Features & Benefits
HIGHEST FIDELITY SIGNAL CAPTURE
  • Very Low Time-base Jitter
  • 425 fs Typical on up to 8 Simultaneously Acquired Channels
  • <200 fs Typical on up to 6 Channels with 82A04 Phase Reference Module
  • Best Vertical Resolution – 16 bit A/D
  • Electrical Resolution: <20 µV LSB (for 1 V full range)
  • Optical Resolution depends on the Dynamic Range of the Optical Module – Ranges from <20 nW for the 80C07B (1 mW full range) to <0.6 µW for the 80C10B (30 mW full range)
FLEXIBLE CONFIGURATIONS
  • With Today’s Sampling Module Portfolio, the DSA8300 supports up to 8 Simultaneously Acquired Signals
  • A Wide Variety of Optical, Electrical, and Accessory Modules to support your Specific Testing Requirements
Optical Modules
  • Fully Integrated Optical Modules that support all Standard Optical Data Rates from 155 Mb/s to 100 Gb/s
  • Certified Optical Reference Receivers Support Specified Requirements for Standards-mandated Compliance Testing
  • Optical Bandwidths to >80 GHz
  • High Optical Sensitivity and Low Noise as well as the Wide Dynamic Range of the Optical Sampling Modules allows Accurate Testing and Characterization of Short-reach to Long-haul Optical Communications Standards
  • Fully Calibrated Clock Recovery Solutions – No need to manually calibrate for data pick-off losses
  • Calibrated Extinction Ratio Measurements ensure Repeatability of Extinction Ratio Measurements to <0.5 dB among Systems with Modules with this Factory Calibration Option
Electrical Modules
  • Electrical Bandwidths to >70 GHz
  • Very Low-noise Electrical Samplers (280 µV at 20 GHz, 450 µV at 60 GHz, typical)
  • Selectable Bandwidths (with 80E07, 08, 09, 10) allow the User to Trade-off Sampler Bandwidth and Noise for Optimal Data Acquisition Performance
  • Remote Samplers (80E07, 08, 09, 10) or Compact Sampling Extender Module Cables support Minimal Signal Degradation by allowing the Sampler to be Located in Close Proximity to the Device Under Test
  • World’s Highest-performance Integrated TDR (10 ps typical step rise time) supports Exceptional Impedance Discontinuity Characterization and High Dynamic Range for S-parameter Measurements to 50 GHz
ANALYSIS
  • Standard Analysis Capabilities
  • Complete Suite of over 120 Automated Measurements for NRZ, RZ, and Pulse Signal Types
  • Automated Mask Testing with over 80 Industry-standard Masks. New Masks can be Imported into the DSA8300 to support New Emerging Standards. In Addition, Users can Define their own Masks for Automated Mask Testing
  • Vertical and Horizontal Histograms for Statistical Analysis of Acquired Waveforms
  • Vertical, Horizontal, and Waveform Cursors (with measurements)
  • Jitter, Noise, BER, and Serial Data Link Analysis is provided through the 80SJNB Basic and Advanced Software Application Options
  • Advanced TDR Analysis, S-parameter Measurements, Simulation Model Extraction, and Serial Link Simulation Capabilities are provided through the IConnect® Software Application Options
HIGH TEST THROUGHPUT
  • High Sample Acquisition Rate up to 300 kS/s per channel
  • Efficient Programmatic Interface (IEEE-488, Ethernet, or local processor access) enable High Test Throughput
Applications
  • Design/Verification of Telecom and Datacom Components and Systems
  • Manufacturing/Testing for ITU/ANSI/IEEE/SONET/SDH Compliance
  • High-performance True-differential TDR Measurements
  • Impedance Characterization and Network Analysis for Serial Data Applications including S-parameters
  • Advanced Jitter, Noise, and BER Analysis
  • Channel and Eye Diagram Simulation and Measurement-based SPICE Modeling

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